Fundamentals of Electromigration-Aware Integrated Circuit Design
€ 174,90
Substituído por 9783031800221
Envio em 4/5 dias
Informação do Produto
| ISBN | 9783319735573 |
|---|---|
| Autores | Jens Lienig, Matthias Thiele |
| Editora | Springer International Publishing AG |
| Formato | Capa dura |
| Número de páginas | 159 |
| Peso (kg) | 0,434 |
| Data de Publicação | 07/03/2018 |
| Preço (iva excl.) | € 165,00 |
| Imposto | € 9,90 |
| Preço (iva inc.) | € 174,90 |
| Disponibilidade | 2 unidades em armazém externo |
Descrição do Produto
The book provides a comprehensive overview of electromigration and its effects on the reliability of electronic circuits. It introduces the physical process of electromigration, which gives the reader the requisite understanding and knowledge for adopting appropriate counter measures. A comprehensive set of options is presented for modifying the present IC design methodology to prevent electromigration. Finally, the authors show how specific effects can be exploited in present and future technologies to reduce electromigration''s negative impact on circuit reliability.