Semiconductor Interfaces: Formation and Properties
145,90 €
Información del producto
| ISBN | 9783642729690 |
|---|---|
| Editorial | Springer-Verlag Berlin and Heidelberg GmbH & Co. KG |
| Precio (sin IVA) | 137,64 € |
| Impuestos | 8,26 € |
| Precio (IVA incluido) | 145,90 € |
| Disponibilidad | No disponible |
Descripción del producto
(ii) Fine characterization down to the atomic scale using recently devel oped, powerful techniques such as scanning tunneling microscopy, high reso lution transmission electron microscopy, glancing incidence x-ray diffraction, x-ray standing waves, surface extended x-ray absorption fine structure and surface extended energy-loss fine structure.