Thin Film Analysis by X-Ray Scattering
203,90 €
Información del producto
| ISBN | 9783527310524 |
|---|---|
| Editorial | Wiley-VCH Verlag GmbH |
| Precio (sin IVA) | 192,36 € |
| Impuestos | 11,54 € |
| Precio (IVA incluido) | 203,90 € |
| Disponibilidad | No disponible |
Descripción del producto
With contributions by Paul F. Fewster and Christoph Genzel While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of thin films.