Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis
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Información del producto
| ISBN | 9780387857305 |
|---|---|
| Editorial | Springer-Verlag New York Inc. |
| Precio (sin IVA) | 181,04 € |
| Impuestos | 10,86 € |
| Precio (IVA incluido) | 191,90 € |
| Disponibilidad | 1 Unidad En almacén externo |
Descripción del producto
The analytical system depends on collecting the x-ray photons that are generated within the sample as a consequence of interaction with the same high energy beam of primary electrons used to produce images.